Publishing a new blog post at the website of the STAR Research and Innovation Action (https://star-ai.eu/), UBITECH’s Entso Veliou, Dimitris Papamartzivanos and Thanassis Giannetsos (members of the Digital Security and Trusted Computing Research Group) discuss the benefits from the wide applicability of AI-enabled data verification frameworks in manufacturing environments, employing deep learning techniques in the form of neural networks to address the issue of possible data poisoning and evasion attacks in smart manufacturing environments while demonstrating high accuracy and scalability.
For more info, please visit our blog spot at https://star-ai.eu/perfect-match-how-secure-ai-can-shape-future-manufacturing
